Three-way data analysis of a wheat growing experiment using near infrared spectral data

Abstract

An agricultural growing experiment cultivating 10 cultivars at five localities produced whole wheat flour samples that were analysed by Fourier transform near infrared (FT-NIR) spectroscopy. This produced a three-way data array: locality x cultivar x wavelength. By taking smoothing first derivatives and removing a noisy part of the spectra meaningful PARAFAC (PARAllel FACtor analysis) models could be produced. Two factors could be interpreted spectroscopically, showing that cultivar properties are related in a not so trivial way to average wheat hardness values and that locality variations are straightforwardly related to average protein content. Copyright 0 2008 John Wiley & Sons, Ltd.

Keywords

Parallel Factor Analysis; three-way array; ANOVA layout; near infrared spectra; wheat cultivars; localities; wheat hardness; protein content

Published in

Journal of Chemometrics
2008, volume: 22, number: 3-4, pages: 247-251

SLU Authors

• Geladi, Paul

  • Department of Forest Biomaterials and Technology, Swedish University of Agricultural Sciences
    

UKÄ Subject classification

Agricultural Science

Publication identifier

• DOI: https://doi.org/10.1002/cem.1125

Permanent link to this page (URI)

https://res.slu.se/id/publ/18600