A novel trace test for the mean parameters in a multivariate growth curve model

Hamid, Jemila S.; Beyene, Joseph; von Rosen, Dietrich

doi:10.1016/j.jmva.2010.09.001

Research article2011Peer reviewedOpen access

A novel trace test for the mean parameters in a multivariate growth curve model

Hamid, Jemila S.; Beyene, Joseph; von Rosen, Dietrich

Keywords

Estimated likelihood; Growth curve model; Lawley–Hotelling trace test; Restricted likelihood; Satterthwaite approximation; Sums of weighted chi-squares

Published in

Journal of Multivariate Analysis
2011, Volume: 102, number: 2, pages: 238-251

SLU Authors

von Rosen, Dietrich
- Department of Energy and Technology, Swedish University of Agricultural Sciences

UKÄ Subject classification

Probability Theory and Statistics

Publication identifier

DOI: https://doi.org/10.1016/j.jmva.2010.09.001

Permanent link to this page (URI)

https://res.slu.se/id/publ/32945